MIL-DTL-52872D
APPENDIX A
TEST METHOD 1
POWER TEST
1.
TEST APPARATUS:
a.
Power supply, dc - constant voltage, 0 to 25 Vdc, 120 mA minimum
current, line and load regulation 0.1 percent or less, maximum
ripple and noise 5 mV P-P.
b.
Ammeter, dc - 199 mA minimum, resolution 0.1 mA, accuracy 1
percent of reading ±2 LSD (2 times value of least significant
digit), maximum voltage burden 0.3 Vdc, or equivalent analog
unit.
c.
Voltmeter, dc - 3 1/2 digit or greater, resolution 10 mVdc ,
accuracy 0.5 percent of reading ±2 LSD, or equivalent analog
meter. (Note: LSD = the smallest digit (value) that can be
read on the range setting being used).
2.
TEST PROCEDURE:
a.
Place the processor in operation by applying 20 ±0.3 Vdc through
the ammeter to terminals TB1-7 (positive) and TB1-8. The
current shall not exceed 43 mA.
b.
Connect 20 transceivers to TB2 of the processor. The total
current shall not exceed 110 mA.
c.
Reverse the polarity on terminals TB1-7 and TB1-8 for 10
seconds. The current shall not exceed 1 mA.
d.
Reconnect as in step b. The current shall not exceed 110 mA.
e.
Measure the voltage between Test Point 7 (TP7) (positive) and
TP3 (negative) with a voltmeter. The voltage shall be 12 ±1
Vdc.
f.
Vary the voltage across TB1-7 and TB1-8 from 18 to 22 V. The
voltage between TP7 and TP3 (12 ±1 Vdc) shall not vary more than
±100 mV.
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