MIL-DTL-52872D
TABLE IV.
Test schedule for processor and processor CCA .
First
Quality
Test 1/
Requirement
Test
article
Conformance
Paragraph
Paragraph
Individual Sample
1
2
3
4
5
6
X
X
-
Functional
3.5.2.6
4.4.2.4.6
X
-
X
Tamper switch
3.5.2.4
4.4.2.4.4
tolerance 2/
X
-
X
Low Temperature
3.4.1
(a),
4.4.2.5.1
3.4.2
(a)
X
-
X
High Temperature
3.4.1
(a),
4.4.2.5.2
3.4.2
(a)
X
-
X
Humidity
3.4.1
(b),
4.4.2.5.3
3.4.2
(b)
X
-
-
Shock 2/
3.4.2
(c)
4.4.2.5.4
1/
The processor CCA may be placed in a processor enclosure or
equivalent to simulate normal environment.
2/
Required for processor only.
TABLE V.
Test Schedule for transducer kit.
First
Quality
Test 1/
Requirement
Test
article
Conformance
Paragraph
Paragraph
Individual Sample
1
2
3
4
5
6
X
X
-
Functional
3.5.2,
4.4.2.4.7,
3.5.2.9
4.4.2.4.8
X
-
X
Low Temperature
3.4.1 (a),
4.4.2.5.1
3.4.2 (a)
X
-
X
High Temperature
3.4.1 (a),
4.4.2.5.2
3.4.2 (a)
X
-
X
Humidity
3.4.1 (b),
4.4.2.5.3
3.4.2 (b)
1/
The transducer kit may be placed in a transceiver enclosure or
equivalent to simulate normal environment.
4.4.2.3. Test methods. Tests shall be conducted in accordance with the
test methods in Appendix A and as specified herein. Calibration of the test
equipment shall be in accordance with ISO 10012-1.
4.4.2.4.
Functional.
4.4.2.4.1. Power. The UMS shall be tested in accordance with Appendix A
Test Method 1. Nonconformance to 3.5.2.1 shall constitute failure of this
test.
4.4.2.4.2. Performance. The UMS shall be tested in accordance with
Appendix A Test Method 2. Nonconformance to 3.5.2.2 shall constitute failure
of this test.
4.4.2.4.3. Detailed circuit. The UMS shall be tested in accordance with
Appendix A Test Method 3. Nonconformance to 3.5.2.3 shall constitute failure
of this test.
4.4.2.4.4. Tamper switch tolerance test. The UMS and major components
when furnished separately shall be tested in accordance with Appendix A Test
Method 4. Nonconformance to 3.5.2.4 shall constitute failure of this test.
14
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