MIL-DTL-52869C
APPENDIX A
TEST METHOD 1
POWER TEST
1.
TEST APPARATUS:
a. Power supply, dc - constant voltage, adjustable from 18 to 23 Vdc,
100 mA minimum current capacity, line and load regulation 0.5 percent or less,
ripple and noise 5 mV P-P.
b. Ammeter, dc - 100 mA minimum, resolution 0.1 mA, accuracy 3 percent,
maximum voltage burden 0.3 Vdc.
c. Voltmeter, digital, dc (2 required) - 3 1/2 digit or greater, 10 mV
resolution, accuracy ±(0.7 percent of reading ± 1 least significant digit
[LSD]).
2.
TEST PROCEDURE:
a. Connect 20 receivers to TB2 of the processor by connecting TB1-1 and
TB1-2 of each receiver to TB2-1 and TB2-2 respectively of the processor.
b. Place the PUS in operation by applying 20 ±0.3 Vdc through the
ammeter to terminals TB1-7 (positive) and TB1-8 of the processor. The current
shall not exceed 60 mA.
c. Reverse the polarity on terminals TB1-7 and TB1-8 for 10 seconds.
The current shall not exceed 1 mA.
d.
Reconnect as in step b.
The current shall not exceed 60 mA.
e. Measure the voltage between test point 5 (TP5) (positive) and TB1-8
(common) with a voltmeter. The voltage shall be 12 ±0.6 Vdc.
f. Vary the voltage across TB1-7 and TB1-8 from 18 to 22 V.
The voltage
at TP5 (12 ±0.6 Vdc) shall not vary more than ±100 mV.
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