MIL-DTL-52869C
TABLE III.
Test schedule for processor and processor CCA.
Quality conformance
First
Test 1/
Requirement
Test
article
paragraph
paragraph
Individual
Sample
1
2
3
4
5
6
X
X
-
Functional
3.5.2.6
4.4.2.4.6
X
-
X
Tamper switch
3.5.2.4
4.4.2.4.4
tolerance 2/
X
-
X
Low temperature
3.4.1(a),
4.4.2.5.1
3.4.2(a)
X
-
X
High temperature
3.4.1(a),
4.4.2.5.2
3.4.2(a)
X
-
X
Humidity
3.4.1(b),
4.4.2.5.3
3.4.2(b)
X
-
-
Shock 2/
3.4.2(c)
4.4.2.5.4
1/
The processor CCA may be placed in a processor enclosure or equivalent to
simulate normal environment.
2/
Required for processor only.
4.4.2.3 Test methods. Test shall be conducted in accordance with the test
methods in Appendix A and as specified herein. Calibration of the test
equipment shall be in accordance with ISO 10012-1.
4.4.2.4
Functional.
4.4.2.4.1 Power. The PUS shall be tested in accordance with Appendix A
Test Method 1. Nonconformance to 3.5.2.1 shall constitute failure of this
test.
4.4.2.4.2 Performance. The PUS shall be tested in accordance with
Appendix A Test Method 2. Nonconformance to 3.5.2.2 shall constitute failure
of this test.
4.4.2.4.3 Detailed circuit. The PUS shall be tested in accordance with
Appendix A Test Method 3. Nonconformance to 3.5.2.3 shall constitute failure
of this test.
4.4.2.4.4 Tamper switch tolerance test. The PUS shall be tested in
accordance with Appendix A Test Method 4. Nonconformance to 3.5.2.4 shall
constitute failure of this test.
4.4.2.4.5 Receiver and receiver CCA. The receiver and the receiver CCA
shall be tested in accordance with Appendix A Test Method 6. Nonconformance
to 3.5.2.4 and 3.5.2.5 shall constitute failure of this test.
4.4.2.4.6 Processor and processor CCA. The processor and the processor
CCA shall be tested in accordance with Appendix A Test Method 7.
Nonconformance to 3.5.2.4 and 3.5.2.6 shall constitute failure of this test.
4.4.2.5 Environmental. The PUS and major components when furnished
separately shall be subjected to the following environmental tests. The
functional test required (see B.3.2.1 of Appendix B) shall be the test
specified in 4.4.2.4 applicable to the item being furnished, except for the
complete PUS. The functional test for the complete PUS shall be the
operational test, Test Method 5 of Appendix A.
4.4.2.5.1 Low temperature. Low temperature test shall be conducted in
accordance with low temperature test procedure of Appendix B (see B.4.1).
When performing the functional test at -20 °F for the complete PUS (Appendix
11
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