MIL-DTL-52876D
TABLE III.
Test schedule for complete monitor cabinets.
Quality conformance
Requirement
Test
First
Test 1/
paragraph
paragraph
article
Individual
Sample
1
2
3
4
5
6
X
X
-
Continuity 4/
3.5.1
4.4.2.5
X
X
-
Burn-in 5/
3.6
4.4.2.4
X
X
-
Functional
3.5.2,
4.4.2.6.1
3.5.3
X 2/
-
X
Low temperature
3.4.1(a),
4.4.2.7.1
3.4.2(a)
X 2/
-
X
High temperature
3.4.1(a),
4.4.2.7.2
3.4.2(a)
X 2/
-
X
Humidity
3.4.1(b),
4.4.2.7.3
3.4.2(b)
X 2/
-
-
Shock
3.4.2(c)
4.4.2.7.4
X 3/
-
-
Reliability
3.7
4.4.2.8
1/
To test, power supplies and signal modules may be removed from the monitor
cabinets and subjected to required tests individually (except for
continuity test).
2/
Reliability test units not subjected to this test.
3/
Environmental test units not subjected to this test.
4/
Portions of continuity test involving power supply and signal module
connections must be performed or repeated after completing all other
tests.
5/
Burn-in required for power supply component only.
TABLE IV.
Test schedule for power supply.
First
Quality conformance
Test
Requirement
Test
article
paragraph
paragraph
Individual
Sample
1
2
3
4
5
6
X
X
-
Burn-in
3.6
4.4.2.4
X
X
-
Functional
3.5.3
4.4.2.6.2
X
-
X
Low temperature
3.4.1(a),
4.4.2.7.1
3.4.2(a)
X
-
X
High temperature
3.4.1(a),
4.4.2.7.2
3.4.2(a)
X
-
X
Humidity
3.4.1(b),
4.4.2.7.3
3.4.2(b)
X
-
-
Shock
3.4.2(c)
4.4.2.7.4
TABLE V.
Test schedule for signal module.
Quality conformance
First
Test
Requirement
Test
article
paragraph
paragraph
Individual
Sample
1
2
3
4
5
6
X
X
-
Functional
3.5.2
4.4.2.6.3
X
-
X
Low temperature
3.4.1(a),
4.4.2.7.1
3.4.2(a)
X
-
X
High temperature
3.4.1(a),
4.4.2.7.2
3.4.2(a)
X
-
X
Humidity
3.4.1(b),
4.4.2.7.3
3.4.2(b)
X
-
-
Shock
3.4.2(c)
4.4.2.7.4
9
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