MIL-DTL-52876D
4.4.2.3 Test methods. Test shall be conducted in accordance with the test
methods in the appendices and as specified herein. Calibration of the test
equipment shall be in accordance with ISO 10012-1.
4.4.2.4 Burn-in. Each monitor cabinet (power supply component only) and
each power supply when furnished separately shall be subjected to an
eight-hour burn-in. Power supplies shall be aligned in accordance with the
Appendix B alignment procedure prior to the functional test. The appropriate
functional test of 4.4.2.6 shall be performed after completion of burn-in.
During the burn-in, each unit shall be subjected to an abbreviated test as
specified herein three times, but no test shall be initiated less than two
hours after completion of the previous test period. Except as specified
during the test periods:
a.
Each power supply under test shall be continuously energized by the
primary power source specified;
b.
Each power supply, whether as a component of a monitor cabinet, or when
furnished separately, shall have its 20 Vdc and 22.5 Vac outputs deliver
maximum rated currents (±5 percent) specified in table II.
The test to be performed three times during the eight-hour burn-in shall be to
introduce the fast charge load specified in the test method appropriate to the
power supply being tested and maintain for 5 ±1 seconds; after restoring to
float charge operation, remove load from 20 volt output for 5 ±1 seconds; for
each change of operation, verify the voltages during and after the changes are
within allowable tolerances. Noncompliance with the applicable portions of
3.5 shall constitute failure. Failures during burn-in shall be analyzed,
repaired, and corrective action taken as necessary. When specified in the
contract or purchase order (see 6.2), burn-in test reports shall be forwarded
to the contracting officer. Any unit failing during burn-in shall be
subjected to an additional eight-hour burn-in after failure analysis and
repair and successful completion of the functional test.
4.4.2.5 Continuity. Each monitor cabinet shall be tested in accordance
with Appendix A, test method 1. Nonconformance to 3.5.1 shall constitute
failure of this test.
4.4.2.6 Functional. Functional tests of the monitor cabinet and major
components when furnished separately shall be in accordance with 4.4.2.6.1
through 4.4.2.6.3 as applicable.
4.4.2.6.1 Monitor cabinet. The 1, 5 , and 25 zone monitor cabinets shall
be tested by performing the functional test for the power supply in accordance
with Appendix A, test method 2, 3, or 4 as applicable and the functional test
for the signal module in accordance with Appendix A, test method 5. To
perform those tests, the power supply and signal module may be removed from
the monitor cabinet. Nonconformance to 3.5.2 and 3.5.3 shall constitute
failure of this test.
4.4.2.6.2 Power supply. The power supply shall be tested in accordance
with Appendix A, test methods 2, 3, or 4 as applicable. Nonconformance to
3.5.3 shall constitute failure of this test.
4.4.2.6.3 Signal module. The signal module shall be tested in accordance
with Appendix A, test method 5. Nonconformance to 3.5.2 shall constitute
failure of this test.
4.4.2.7 Environmental. The monitor cabinets and major cabinets when
furnished separately shall be subjected to the following environmental tests.
4.4.2.7.1 Low temperature. Low temperature test shall be conducted in
accordance with the low temperature test of Appendix C.
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