MIL-DTL-52876D
4.4.2.7.2 High temperature. High temperature test shall be conducted in
accordance with the high temperature test of Appendix C.
4.4.2.7.3 Humidity. Humidity test shall be conducted in accordance with
the humidity test of Appendix C.
4.4.2.7.4 Shock. Shock test (bench handling) shall be performed in
accordance with the shock test of Appendix C.
4.4.2.7.5 Failure criteria.
Nonconformance to 3.4 shall constitute failure
of these tests.
4.4.2.8 Reliability. Using an upper test MTBF (θ0) of 10,000 hours and a
lower test MTBF (θ1)of 5,000 hours, the monitor cabinets shall be tested as
specified herein, with "accept" and "reject" criteria in accordance with
MIL-HDBK-781, test plan VIIID. Continue testing until either an "accept" or
"reject" decision is reached. All test incidents will be scored by the
Government. A failure is defined as any malfunction which causes or may cause
one or more of the following:
a.
Failure to commence operation, cessation of operation, or degradation of
performance below the designated levels.
b.
Serious damage (see 6.3.2) to the system.
c.
Serious personnel safety hazards.
4.4.2.8.1 Test procedures. One or more monitor cabinets shall be randomly
selected by a Government representative. The tests shall be conducted under
ambient humidity conditions at a room temperature of 77 ±5 °F. Equipment
shall be energized at the primary power input specified herein. Load
resistors R3 and R4 of the applicable Appendix A test methods (2, 3, or 4)
shall be placed across the 20 Vdc and 27 Vdc outputs respectively, except as
required during the test periods described below. Operation shall be
continuous throughout the test. Nine times each 24-hours, but not more often
than once per hour, complete functional tests equivalent to those of Appendix
A test methods 2, 3, or 4 (as applicable) and 5 shall be performed, except
tests to determine sound pressure level, line and load regulation, and fast
charge cut-in and cut-out thresholds, and, for the 25 zone, the thermal
cut-off and external input power, need to be performed only once daily. The
test shall commence only after successful completion of functional testing and
a burn-in period of eight hours (power supply only), as specified in 4.4.2.4.
Failed indicator lamps shall be noted as to time failure is detected and shall
be replaced. Such failures shall not be counted as relevant and any dependent
failures caused thereby are counted as relevant. Alarms not deliberately
excited as part of the equipment test routine shall be reported and cause of
the alarm identified, if practicable. This accounting shall be maintained
separately from the failure accounting. No adjustments shall be allowed
during the test.
4.4.2.8.2 Failure criteria.
Nonconformance to 3.7 shall constitute failure
of this test.
5.
PACKAGING
5.1 Packaging. For acquisition purposes, the packaging requirements shall
be as specified in the contract or order (see 6.2). When actual packaging of
material is to be performed by DOD personnel, these personnel need to contact
the responsible packaging activity to ascertain requisite packaging
requirements. Packaging requirements are maintained by the Inventory Control
Point's packaging activity within the Military Department or Defense Agency,
or within the Military Department's System Command. Packaging data retrieval
is available from the managing Military Department's or Defense Agency's
automated packaging files, CD-ROM products, or by contacting the responsible
packaging activity.
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