MIL-DTL-52876D
4.3.3.1.2 Major components when furnished separately. Each major
component, when furnished separately, shall be subjected to the tests marked
"X" in column 2 of tables IV and V. Failure of any test shall be cause for
rejection.
4.3.3.2
Samples.
4.3.3.2.1 Complete monitor cabinets. Each sample monitor cabinet, selected
in accordance with 4.3.1, shall be subjected to the tests marked "X" in column
3 of table III.
4.3.3.2.2 Major components when furnished separately. Each sample major
component when furnished separately, selected in accordance with 4.3.1, shall
be subjected to the tests marked "X" in column 3 of tables IV or V, as
applicable. Failure of any test shall be cause for rejection.
4.4
Inspection procedure.
4.4.1 Examination. The monitor cabinets and the major components when
furnished separately shall be examined as specified herein for the following
defects (as applicable):
Critical.
1.
Welding burn through.
Major.
101.
Electromagnetic interference suppression components and networks not as
specified on drawings (see 3.1 and 3.1.1).
102.
Components missing or not as specified on drawings(see 3.1, 3.1.1, and
3.1.2).
103.
Assembly not in accordance with drawings (see 3.1, 3.1.1, and 3.1.2).
104.
Materials not as specified (see 3.3).
105.
Materials are not resistant to corrosion and deterioration or treated to
be resistant to corrosion and deterioration for the applicable storage
and operating environments (see 3.3.1).
106.
Dissimilar metals as defined in MIL-STD-889 are not effectively
insulated from each other (see 3.3.2).
107.
Used, rebuilt, or remanufactured components, pieces, or parts
incorporated in the monitor cabinets or major components when furnished
separately (see 3.3.3).
108.
Interchangeability not as specified (see 3.8).
109.
Identification or special marking missing, incomplete or illegible (see
3.9).
110.
Workmanship not as specified (see 3.11).
111.
Welding not in accordance with AWS D9.1 (see 3.11.1).
4.4.2
Tests.
4.4.2.1 Test conditions. Unless otherwise specified herein, tests shall be
conducted at prevailing ambient humidity conditions and at a room ambient
temperature of 77 ±5 °F. Unless otherwise specified herein, the monitor
cabinets and major components when furnished separately shall operate as
specified herein without maintenance.
4.4.2.2
Test schedule.
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